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Citation: LIU Zhong-Liang, REN Peng, LIU Jin-Feng, TANG Jun, XU Peng-Shou. Effect of Predeposited Ge on the Growth of SiC Films on Si(111) by SSMBE[J]. Acta Physico-Chimica Sinica, ;2008, 24(07): 1160-1164. doi: 10.3866/PKU.WHXB20080707 shu

Effect of Predeposited Ge on the Growth of SiC Films on Si(111) by SSMBE

1.
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, P. R. China

Received Date: 30 November 2007
Available Online: 9 May 2008

SiC films were grown at substrate temperature of 900 ℃ by solid source molecular beam epitaxy (SSMBE) on Si(111) with different thicknesses (0, 0.2, 1 nm ) of Ge predeposited on Si prior to the epitaxy of SiC. The films were investigated with reflection high energy electron diffraction (RHEED), atomic force microscopy (AFM), Fourier transforminfrared spectroscopy (FTIR). The results indicated that the quality of the film with Ge predeposition of 0.2 nm was the best. The surface of the sample was even and there were no voids observed. The Ge prdeposition of 0.2 nm suppressed the Si diffusion and decreased the void formation. For the sample without Ge predeposition, the roughness of the surface was larger and there were some voids and Si grains on the surface. For the sample with the Ge prdeposition of 1 nm, island growth mode of Ge caused the surface of SiC films rougher and the crystalline quality of SiC filmworse and even induced the formation of the polycrystalline SiC film.
- Ge; Predeposition; SiC; Si substrate; Solid source molecular beam epitaxy
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沈阳化工大学材料科学与工程学院沈阳 110142

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Effect of Predeposited Ge on the Growth of SiC Films on Si(111) by SSMBE

南开大学师唯/华北电力大学（保定）刘景维：二维配位聚合物中有序的亲锂冠醚位点用于无枝晶锂沉积

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通讯作者: 陈斌, bchen63@163.com