Citation: YUAN Bing-Kai, CHEN Peng-Cheng, ZHANG Jun, CHENG Zhi-Hai, WANG Chen, QIU Xiao-Hui. Research Progress in Atomic Resolution Microscopy[J]. Acta Physico-Chimica Sinica, ;2013, 29(07): 1370-1384. doi: 10.3866/PKU.WHXB201304191 shu

Research Progress in Atomic Resolution Microscopy

1.
1 National Center for Nanoscience and Technology, Beijing 100190, P. R. China;
2 Academy for Advanced Interdisciplinary Studies, Peking University, Beijing 100871, P. R. China

Received Date: 14 January 2013
Available Online: 19 April 2013
Fund Project: 国家重大科学研究计划(2012CB933001) (2012CB933001)国家自然科学基金(21173058)资助 (21173058)

Tremendous progress has been made in non-contact atomic force microscopy (NC-AFM) recently. The spatial resolution of NC-AFM imaging and spectroscopy of individual molecules on surfaces has reached true atomic resolution and bond differentiation level. Combination of NC-AFM with other scanning probe techniques can open a new way for materials, physics, chemistry, and biochemistry studies. In this review, we first introduce the basic principle of NC-AFM and qPlus sensor. The interaction force at atomic scale and precise measurement of short-range force are discussed. We summarize the recent advances in structural determination of organic molecules, chemical identification, electronic structure, and atomic manipulation at the atomic scale. In addition, we also discuss the application of Kelvin probe force microscopy (KPFM) in measurement of local contact potential difference (LCPD). Finally, perspectives and challenges in NC-AFM techniques are presented.
- Scanning probe microscopy,
- Non-contact atomic force microscopy,
- qPlus sensor,
- Chemical identification,
- Atomic manipulation,
- Electronic structure,
- Kelvin probe force microscopy
1. [1]
  
  (1) Binnig, G.; Rohrer, H.; Gerber, C.;Weibel, E. Phys. Rev. Lett.1982, 49, 57. doi: 10.1103/PhysRevLett.49.57
2. [2]
  (2) Teague, E. C. Bull. Am. Phys. Soc. 1978, 23, 290.
3. [3]
  (3) Coombs, J. H.; Pethica, J. B. IBM J. Res. Dev. 1986, 30, 455.doi: 10.1147/rd.305.0455
4. [4]
  (4) Binnig, G.; Quate, C. F.; Gerber, C. Phys. Rev. Lett. 1986, 56,930. doi: 10.1103/PhysRevLett.56.930
5. [5]
  (5) García, R.; Pérez, R. Surf. Sci. Rep. 2002, 47, 197. doi: 10.1016/S0167-5729(02)00077-8
6. [6]
  (6) Martin, Y.;Williams, C. C.;Wickramasinghe, H. K. J. Appl.Phys. 1987, 61, 4723. doi: 10.1063/1.338807
7. [7]
  (7) Zhong, Q.; Inniss, D.; Kjoller, K.; Elings, V. B. Surf. Sci. Lett.1993, 290, L688.
8. [8]
  (8) Albrecht, T. R.; Grütter, P.; Horne, D.; Rugar, D. J. Appl. Phys.1991, 69, 668. doi: 10.1063/1.347347
9. [9]
  (9) Gross, L. Nat. Chem. 2011, 3, 273. doi: 10.1038/nchem.1008
10. [10]
  (10) Gross, L.; Mohn, F.; Moll, N.; Schuler, B.; Criado, A.; Guitián,E.; Peña, D.; urdon, A.; Meyer, G. Science 2012, 337, 1326.doi: 10.1126/science.1225621
11. [11]
  (11) Baykara, M. Z.; Schwendemann, T. C.; Altman, E. I.; Schwarz,U. D. Adv. Mater. 2010, 22, 2838. doi: 10.1002/adma.200903909
12. [12]
  (12) Mohn, F.; Gross, L.; Moll, N.; Meyer, G. Nat. Nanotechnol.2012, 7, 227. doi: 10.1038/nnano.2012.20
13. [13]
  (13) Melitz,W.; Shen, J.; Kummel, A. C.; Lee, S. Surf. Sci. Rep.2011, 66, 1. doi: 10.1016/j.surfrep.2010.10.001
14. [14]
  (14) Barth, C.; Foster, A. S.; Henry, C. R.; Shluger, A. L. Adv. Mater.2011, 23, 477. doi: 10.1002/adma.v23.4
15. [15]
  (15) Giessibl, F. J. Rev. Mod. Phys. 2003, 75, 949. doi: 10.1103/RevModPhys.75.949
16. [16]
  (16) Pérez, R.; Štich, I.; Payne, M. C.; Terakura, K. Phys. Rev. B1998, 58, 10835. doi: 10.1103/PhysRevB.58.10835
17. [17]
  (17) Livshits, A. I.; Shluger, A. L.; Rohl, A. L.; Foster, A. S. Phys.Rev. B 1999, 59, 2436. doi: 10.1103/PhysRevB.59.2436
18. [18]
  (18) Moll, N.; Gross, L.; Mohn, F.; Curioni, A.; Meyer, G. N. J.Phys. 2010, 12, 125020. doi: 10.1088/1367-2630/12/12/125020
19. [19]
  (19) Moll, N.; Gross, L.; Mohn, F.; Curioni, A.; Meyer, G. N. J.Phys. 2012, 14, 083023. doi: 10.1088/1367-2630/14/8/083023
20. [20]
  (20) Custance, Ó.; Oyabu, N.; Sugimoto, Y. Force Spectroscopy onSemiconductor Surfaces. In Noncontact Atomic ForceMicroscopy; Morita, S., Giessibl, F. J.,Wiesendanger, R. Eds.;Springer: Berlin, 2009; Vol. 2, pp 31-68.
21. [21]
  (21) Giessibl, F. J. Materials Today 2005, 8, 32.
22. [22]
  (22) Torbrugge, S.; Schaff, O.; Rychen, J. J. Vac. Sci. Technol. B2010, 28, C4E12.
23. [23]
  (23) An, T.; Nishio, T.; Eguchi, T.; Ono, M.; Nomura, A.; Akiyama,K.; Hasegawa, Y. Rev. Sci. Instrum. 2008, 79, 033703.doi: 10.1063/1.2830937
24. [24]
  (24) Giessibl, F. J. Appl. Phys. Lett. 1998, 73, 3956. doi: 10.1063/1.122948
25. [25]
  (25) Heyde, M.; Kulawik, M.; Rust, H. P.; Freund, H. J. Rev. Sci.Instrum. 2004, 75, 2446. doi: 10.1063/1.1765753
26. [26]
  (26) Giessibl, F. J.; Pielmeier, F.; Eguchi, T.; An, T.; Hasegawa, Y.Phys. Rev. B 2011, 84, 125409.
27. [27]
  (27) Giessibl, F. J. Principles and Applications of the qPlus Sensor.In Noncontact Atomic Force Microscopy; Morita, S., Giessibl,F. J.,Wiesendanger, R. Eds.; Springer: Berlin, 2009; Vol. 2, pp121-142.
28. [28]
  (28) Sader, J. E.; Jarvis, S. P. Appl. Phys. Lett. 2004, 84, 1801.doi: 10.1063/1.1667267
29. [29]
  (29) Hamaker, H. C. Physica 1937, 4, 1058. doi: 10.1016/S0031-8914(37)80203-7
30. [30]
  (30) Israelachvili, J. Intermolecular and Surface Forces, 3rd ed.;Academic Press: San Die , 2011.
31. [31]
  (31) Argento, C.; French, R. H. J. Appl. Phys. 1996, 80, 6081.doi: 10.1063/1.363680
32. [32]
  (32) Ruschmeier, K.; Schirmeisen, A.; Hoffmann, R. Phys. Rev. Lett.2008, 101, 156102. doi: 10.1103/PhysRevLett.101.156102
33. [33]
  (33) Such, B.; Glatzel, T.; Kawai, S.; Koch, S.; Meyer, E. J. Vac. Sci.Technol. B 2010, 28, C4B1.
34. [34]
  (34) Kawai, S.; Glatzel, T.; Koch, S.; Baratoff, A.; Meyer, E. Phys.Rev. B 2011, 83, 035421. doi: 10.1103/PhysRevB.83.035421
35. [35]
  (35) Sun, Z. X.; Boneschanscher, M. P.; Swart, I.; Vanmaekelbergh,D.; Liljeroth, P. Phys. Rev. Lett. 2011, 106, 046104. doi: 10.1103/PhysRevLett.106.046104
36. [36]
  (36) Fremy, S.; Kawai, S.; Pawlak, R.; Glatzel, T.; Baratoff, A.;Meyer, E. Nanotechnology 2012, 23, 055401. doi: 10.1088/0957-4484/23/5/055401
37. [37]
  (37) Albers, B. J.; Schwendemann, T. C.; Baykara, M. Z.; Pilet, N.;Liebmann, M.; Altman, E. I.; Schwarz, U. D. Nanotechnology2009, 20, 264002. doi: 10.1088/0957-4484/20/26/264002
38. [38]
  (38) Albers, B. J.; Schwendemann, T. C.; Baykara, M. Z.; Pilet, N.;Liebmann, M.; Altman, E. I.; Schwarz, U. D. Nat. Nanotechnol.2009, 4, 307. doi: 10.1038/nnano.2009.57
39. [39]
  (39) Weiss, C.;Wagner, C.; Temirov, R.; Tautz, F. S. J. Am. Chem.Soc. 2010, 132, 11864. doi: 10.1021/ja104332t
40. [40]
  (40) Temirov, R.; Soubatch, S.; Neucheva, O.; Lassise, A. C.; Tautz,F. S. N. J. Phys. 2008, 10, 053012. doi: 10.1088/1367-2630/10/5/053012
41. [41]
  (41) Weiss, C.;Wagner, C.; Kleimann, C.; Rohlfing, M.; Tautz, F. S.;Temirov, R. Phys. Rev. Lett. 2010, 105, 086103. doi: 10.1103/PhysRevLett.105.086103
42. [42]
  (42) Kichin, G.;Weiss, C.;Wagner, C.; Tautz, F. S.; Temirov, R.J. Am. Chem. Soc. 2011, 133, 16847. doi: 10.1021/ja204624g
43. [43]
  (43) Giessibl, F. J. Science 1995, 267, 68. doi: 10.1126/science.267.5194.68
44. [44]
  (44) Noncontact Atomic Force Microscopy; Morita, S.,Wiesendanger, R., Meyer, E. Eds.; Springer: Berlin, 2002; Vol. 1.
45. [45]
  (45) Morita, S. Introduction. In Noncontact Atomic ForceMicroscopy; Morita, S., Giessibl, F. J.,Wiesendanger, R. Eds.;Springer: Berlin, 2009; Vol. 2; pp 1-13.
46. [46]
  (46) Giessibl, F. J.; Hembacher, S.; Bielefeldt, H.; Mannhart, J.Science 2000, 289, 422. doi: 10.1126/science.289.5478.422
47. [47]
  (47) Hembacher, S.; Giessibl, F. J.; Mannhart, J. Science 2004, 305,380. doi: 10.1126/science.1099730
48. [48]
  (48) Gross, L.; Mohn, F.; Moll, N.; Liljeroth, P.; Meyer, G. Science2009, 325, 1110. doi: 10.1126/science.1176210
49. [49]
  (49) Pawlak, R.; Kawai, S.; Fremy, S.; Glatzel, T.; Meyer, E. ACSNano 2011, 5, 6349. doi: 10.1021/nn201462g
50. [50]
  (50) Pawlak, R.; Kawai, S.; Fremy, S.; Glatzel, T.; Meyer, E. J. Phys.Condes. Matter 2012, 24, 084005. doi: 10.1088/0953-8984/24/8/084005
51. [51]
  (51) Boneschanscher, M. P.; van der Lit, J.; Sun, Z.; Swart, I.;Liljeroth, P.; Vanmaekelbergh, D. ACS Nano 2012, 6, 10216.doi: 10.1021/nn3040155
52. [52]
  (52) Pérez, R. Science 2012, 337, 1305. doi: 10.1126/science.1227726
53. [53]
  (53) Gross, L.; Mohn, F.; Moll, N.; Meyer, G.; Ebel, R.; Abdel-Mageed,W. M.; Jaspars, M. Nat. Chem. 2010, 2, 821.doi: 10.1038/nchem.765
54. [54]
  (54) Welker, J.; Giessibl, F. J. Science 2012, 336, 444. doi: 10.1126/science.1219850
55. [55]
  (55) Mohn, F.; Repp, J.; Gross, L.; Meyer, G.; Dyer, M. S.; Persson,M. Phys. Rev. Lett. 2010, 105, 266102. doi: 10.1103/PhysRevLett.105.266102
56. [56]
  (56) Pavliek, N.; Fleury, B.; Neu, M.; Niedenführ, J.; Herranz-Lancho, C.; Ruben, M.; Repp, J. Phys. Rev. Lett. 2012, 108,086101. doi: 10.1103/PhysRevLett.108.086101
57. [57]
  (57) Stipe, B. C.; Rezaei, M. A.; Ho,W. Science 1998, 280, 1732.doi: 10.1126/science.280.5370.1732
58. [58]
  (58) Setvín, M.; Mutombo, P.; Ondrácek, M.; Majzik, Z.; Švec, M.;Cháb, V.; Oštádal, I.; Sobotík, P.; Jelínek, P. ACS Nano 2012,6, 6969. doi: 10.1021/nn301996k
59. [59]
  (59) Sugimoto, Y.; Pou, P.; Abe, M.; Jelinek, P.; Perez, R.; Morita, S.;Custance, Ó. Nature 2007, 446, 64. doi: 10.1038/nature05530
60. [60]
  (60) Hoffmann, R.; Kantorovich, L. N.; Baratoff, A.; Hug, H. J.;Güntherodt, H. J. Phys. Rev. Lett. 2004, 92, 146103.doi: 10.1103/PhysRevLett.92.146103
61. [61]
  (61) Lantz, M. A.; Hoffmann, R.; Foster, A. S.; Baratoff, A.; Hug, H.J.; Hidber, H. R.; Güntherodt, H. J. Phys. Rev. B 2006, 74,245426. doi: 10.1103/PhysRevB.74.245426
62. [62]
  (62) Foster, A. S.; Barth, C.; Henry, C. R. Phys. Rev. Lett. 2009, 102,256103. doi: 10.1103/PhysRevLett.102.256103
63. [63]
  (63) Hoffmann, R.;Weiner, D.; Schirmeisen, A.; Foster, A. S. Phys.Rev. B 2009, 80, 115426. doi: 10.1103/PhysRevB.80.115426
64. [64]
  (64) Lantz, M. A.; Hug, H. J.; Hoffmann, R.; van Schendel, P. J. A.;Kappenberger, P.; Martin, S.; Baratoff, A.; Güntherodt, H. J.Science 2001, 291, 2580. doi: 10.1126/science.1057824
65. [65]
  (65) Guo, C. S.; Van Hove, M. A.; Zhang, R. Q.; Minot, C. Langmuir2010, 26, 16271. doi: 10.1021/la101317s
66. [66]
  (66) Eigler, D. M.; Schweizer, E. K. Nature 1990, 344, 524.doi: 10.1038/344524a0
67. [67]
  (67) Bartels, L.; Meyer, G.; Rieder, K. H. Phys. Rev. Lett. 1997, 79,697. doi: 10.1103/PhysRevLett.79.697
68. [68]
  (68) Bartels, L.; Meyer, G.; Rieder, K. H. Appl. Phys. Lett. 1997, 71,213. doi: 10.1063/1.119503
69. [69]
  (69) Eigler, D. M.; Lutz, C. P.; Rudge,W. E. Nature 1991, 352, 600.doi: 10.1038/352600a0
70. [70]
  (70) Crommie, M. F.; Lutz, C. P.; Eigler, D. M. Science 1993, 262,218. doi: 10.1126/science.262.5131.218
71. [71]
  (71) Yamachika, R.; Grobis, M.;Wachowiak, A.; Crommie, M. F.Science 2004, 304, 281. doi: 10.1126/science.1095069
72. [72]
  (72) Custance, Ó.; Pérez, R.; Morita, S. Nat. Nanotechnol. 2009, 4,803. doi: 10.1038/nnano.2009.347
73. [73]
  (73) Tseng, A. A. Nano Today 2011, 6, 493. doi: 10.1016/j.nantod.2011.08.003
74. [74]
  (74) Oyabu, N.; Custance, Ó.; Yi, I.; Sugawara, Y.; Morita, S. Phys.Rev. Lett. 2003, 90, 176102. doi: 10.1103/PhysRevLett.90.176102
75. [75]
  (75) Sugimoto, Y.; Jelinek, P.; Pou, P.; Abe, M.; Morita, S.; Custance,Ó.; Pérez, R. Phys. Rev. Lett. 2007, 98, 106104. doi: 10.1103/PhysRevLett.98.106104
76. [76]
  (76) Oyabu, N.; Sugimoto, Y.; Abe, M.; Custance, Ó.; Morita, S.Nanotechnology 2005, 16, S112.
77. [77]
  (77) Sugimoto, Y.; Abe, M.; Hirayama, S.; Oyabu, N.; Custance, Ó.;Morita, S. Nat. Mater. 2005, 4, 156. doi: 10.1038/nmat1297
78. [78]
  (78) Sugimoto, Y.; Custance, Ó.; Abe, M.; Morita, S. e-J. Surf. Sci.Nanotech. 2006, 4, 376. doi: 10.1380/ejssnt.2006.376
79. [79]
  (79) Sugimoto, Y.; Pou, P.; Custance, Ó.; Jelinek, P.; Abe, M.; Pérez,R.; Morita, S. Science 2008, 322, 413. doi: 10.1126/science.1160601
80. [80]
  (80) Swart, I.; Sonnleitner, T.; Niedenführ, J.; Repp, J. Nano Lett.2012, 12, 1070. doi: 10.1021/nl204322r
81. [81]
  (81) Hirth, S.; Ostendorf, F.; Reichling, M. Nanotechnology 2006,17, S148.
82. [82]
  (82) Nishi, R.; Miyagawa, D.; Seino, Y.; Yi, I.; Morita, S.Nanotechnology 2006, 17, S142.
83. [83]
  (83) Yi, I.; Nishi, R.; Abe, M.; Sugimoto, Y.; Morita, S. Jpn. J. Appl.Phys. Lett. 2011, 50, 015201. doi: 10.1143/JJAP.50.015201
84. [84]
  (84) Ternes, M.; Lutz, C. P.; Hirjibehedin, C. F.; Giessibl, F. J.;Heinrich, A. J. Science 2008, 319, 1066. doi: 10.1126/science.1150288
85. [85]
  (85) Mao, H. Q.; Li, N.; Chen, X.; Xue, Q. K. J. Phys. Condes.Matter 2012, 24, 084004. doi: 10.1088/0953-8984/24/8/084004
86. [86]
  (86) Fournier, N.;Wagner, C.;Weiss, C.; Temirov, R.; Tautz, F. S.Phys. Rev. B 2011, 84, 035435. doi: 10.1103/PhysRevB.84.035435
87. [87]
  (87) Wagner, C.; Fournier, N.; Tautz, F. S.; Temirov, R. Phys. Rev.Lett. 2012, 109, 076102. doi: 10.1103/PhysRevLett.109.076102
88. [88]
  (88) Pawlak, R.; Fremy, S.; Kawai, S.; Glatzel, T.; Fang, H.; Fendt,L. A.; Diederich, F.; Meyer, E. ACS Nano 2012, 6, 6318.doi: 10.1021/nn301774d
89. [89]
  (89) Zhao, J.W.; Liu, H. M.; Ni,W. B.; Guo, Y.; Yin, X. ActaPhys. -Chim. Sin. 2009, 25, 1472. [赵建伟, 刘洪梅, 倪文彬,郭彦, 尹星. 物理化学学报, 2009, 25, 1472.] doi: 10.3866/PKU.WHXB20090744
90. [90]
  (90) Ai, Y.; Zhang, H. L. Acta Phys. -Chim. Sin. 2012, 28, 2237.[艾勇, 张浩力. 物理化学学报, 2012, 28, 2237.]doi: 10.3866/PKU.WHXB201209102
91. [91]
  (91) Rubio-Bollinger, G.; Joyez, P.; Agraït, N. Phys. Rev. Lett.2004, 93, 116803. doi: 10.1103/PhysRevLett.93.116803
92. [92]
  (92) Schirmeisen, A.; Cross, G.; Stalder, A.; Grütter, P.; Dürig, U.N. J. Phys. 2000, 2, 29. doi: 10.1088/1367-2630/2/1/329
93. [93]
  (93) Sun, Y.; Mortensen, H.; Schär, S.; Lucier, A. S.; Miyahara, Y.;Grütter, P.; Hofer,W. Phys. Rev. B 2005, 71, 193407.doi: 10.1103/PhysRevB.71.193407
94. [94]
  (94) Hembacher, S.; Giessibl, F. J.; Mannhart, J.; Quate, C. F. Phys.Rev. Lett. 2005, 94, 056101. doi: 10.1103/PhysRevLett.94.056101
95. [95]
  (95) Chen, C. J. Nanotechnology 2005, 16, S27.
96. [96]
  (96) Hofer,W. A.; Fisher, A. J. Phys. Rev. Lett. 2003, 91, 036803.doi: 10.1103/PhysRevLett.91.036803
97. [97]
  (97) Sawada, D.; Sugimoto, Y.; Morita, K. I.; Abe, M.; Morita, S.Appl. Phys. Lett. 2009, 94, 173117. doi: 10.1063/1.3127503
98. [98]
  (98) Ternes, M.; nzález, C.; Lutz, C. P.; Hapala, P.; Giessibl, F.J.; Jelínek, P.; Heinrich, A. J. Phys. Rev. Lett. 2011, 106,016802. doi: 10.1103/PhysRevLett.106.016802
99. [99]
  (99) Majzik, Z.; Setvín, M.; Bettac, A.; Feltz, A.; Cháb, V.; Jelínek,P. Beilstein J. Nanotechnol. 2012, 3, 249. doi: 10.3762/bjnano.3.28
100. [100]
  (100) Hauptmann, N.; Mohn, F.; Gross, L.; Meyer, G.; Frederiksen,T.; Berndt, R. N. J. Phys. 2012, 14, 073032. doi: 10.1088/1367-2630/14/7/073032
101. [101]
  (101) Jelínek, P.; Švec, M.; Pou, P.; Pérez, R.; Cháb, V. Phys. Rev.Lett. 2008, 101, 176101. doi: 10.1103/PhysRevLett.101.176101
102. [102]
  (102) Schull, G.; Frederiksen, T.; Brandbyge, M.; Berndt, R. Phys.Rev. Lett. 2009, 103, 206803. doi: 10.1103/PhysRevLett.103.206803
103. [103]
  (103) Schull, G.; Dappe, Y. J.; nzález, C. S.; Bulou, H.; Berndt, R.Nano Lett. 2011, 11, 3142. doi: 10.1021/nl201185y
104. [104]
  (104) Sweetman, A.; Jarvis, S.; Danza, R.; Bamidele, J.;Gan padhyay, S.; Shaw, G. A.; Kantorovich, L.; Moriarty, P.Phys. Rev. Lett. 2011, 106, 136101. doi: 10.1103/PhysRevLett.106.136101
105. [105]
  (105) Nonnenmacher, M.; O'Boyle, M. P.;Wickramasinghe, H. K.Appl. Phys. Lett. 1991, 58, 2921. doi: 10.1063/1.105227
106. [106]
  (106) Sadewasser, S.; Jelinek, P.; Fang, C. K.; Custance, Ó.; Yamada,Y.; Sugimoto, Y.; Abe, M.; Morita, S. Phys. Rev. Lett. 2009,103, 266103. doi: 10.1103/PhysRevLett.103.266103
107. [107]
  (107) König, T.; Heinke, L.; Simon, G. H.; Heyde, M. Phys. Rev. B2011, 83, 195435. doi: 10.1103/PhysRevB.83.195435
108. [108]
  (108) Küppers, J.;Wandelt, K.; Ertl, G. Phys. Rev. Lett. 1979, 43,928. doi: 10.1103/PhysRevLett.43.928
109. [109]
  (109) Wandelt, K. Appl. Surf. Sci. 1997, 111, 1. doi: 10.1016/S0169-4332(96)00692-7
110. [110]
  (110) Glatzel, T. Measuring Atomic-Scale Variations of theElectrostatic Force. In Kelvin Probe Force Microscopy;Sadewasser, S., Glatzel, T. Eds.; Springer: Berlin, 2012; pp289-327.
111. [111]
  (111) Gross, L.; Mohn, F.; Liljeroth, P.; Repp, J.; Giessibl, F. J.;Meyer, G. Science 2009, 324, 1428. doi: 10.1126/science.1172273
112. [112]
  (112) Liljeroth, P.; Repp, J.; Meyer, G. Science 2007, 317, 1203.doi: 10.1126/science.1144366
113. [113]
  (113) Leoni, T.; Guillermet, O.;Walch, H.; Langlais, V.;Scheuermann, A.; Bonvoisin, J.; Gauthier, S. Phys. Rev. Lett.2011, 106, 216103. doi: 10.1103/PhysRevLett.106.216103
114. [114]
  (114) Walch, H.; Leoni, T.; Guillermet, O.; Langlais, V.;Scheuermann, A.; Bonvoisin, J.; Gauthier, S. Phys. Rev. B2012, 86, 075423. doi: 10.1103/PhysRevB.86.075423
115. [115]
  (115) König, T.; Simon, G. H.; Heinke, L.; Lichtenstein, L.; Heyde,M. Beilstein J. Nanotechnol. 2011, 2, 1. doi: 10.3762/bjnano.2.1
116. [116]
  (116) König, T.; Simon, G. H.; Rust, H. P.; Pacchioni, G.; Heyde,M.; Freund, H. J. J. Am. Chem. Soc. 2009, 131, 17544.doi: 10.1021/ja908049n
117. [117]
  (117) Heinke, L.; Lichtenstein, L.; Simon, G. H.; König, T.; Heyde,M.; Freund, H. J. ChemPhysChem 2010, 11, 2085.doi: 10.1002/cphc.v11:10
118. [118]
  (118) Nikiforov, M. P.; Zerweck, U.; Milde, P.; Loppacher, C.; Park,T. H.; Uyeda, H. T.; Therien, M. J.; Eng, L.; Bonnell, D. NanoLett. 2008, 8, 110. doi: 10.1021/nl072175d
119. [119]
  (119) Ichii, T.; Fukuma, T.; Yoda, T.; Kobayashi, K.; Matsushige, K.;Yamada, H. J. Appl. Phys. 2010, 107, 024315. doi: 10.1063/1.3284094
120. [120]
  (120) Barth, C.; Pakarinen, O. H.; Foster, A. S.; Henry, C. R.Nanotechnology 2006, 17, S128.
121. [121]
  (121) Loth, S.; Etzkorn, M.; Lutz, C. P.; Eigler, D. M.; Heinrich, A. J.Science 2010, 329, 1628. doi: 10.1126/science.1191688
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