Citation: ZHOU Ai-Jun, CUI Heng-Guan, LI Jing-Ze, ZHAO Xin-Bing. Structure and Morphology of Induction-Melted Higher Manganese Silicide[J]. Acta Physico-Chimica Sinica, ;2011, 27(12): 2915-2919. doi: 10.3866/PKU.WHXB20112915 shu

Structure and Morphology of Induction-Melted Higher Manganese Silicide

1.
1. State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China,Chengdu 610054, P. R. China;
2. State Key Laboratory of Silicon Materials, Zhejiang University, Hangzhou 310027, P. R. China

Received Date: 1 July 2011
Available Online: 23 September 2011
Fund Project: 国家自然科学基金(51102039) (51102039) 中央高校基本科研业务费(ZYGX2010J033) (ZYGX2010J033)中国博士后科学基金(20100481375, 201104640)资助项目 (20100481375, 201104640)

Field emission scanning microscopy (FESEM) and energy-dispersive X-ray spectroscopy (EDXS) were used to study the morphology and composition of secondary phase precipitations in induction-melted higher manganese silicide (HMS). Striations of the secondary phase were observed in individual HMS crystals with an average interval of 5-30 μm and a thickness of ~30 nm. The chemical composition of the striations was examined and found to be MnSi, which was observed as an amorphous phase by high resolution transmission electron microscopy (HRTEM). The crystal structure of HMS was determined by selective area electron diffraction (SAED) and the results indicated a single Mn₄Si₇ phase in the as-prepared material and no other incommensurate HMS phases were found. After ball milling and hot pressing many defects and stress fields were observed in the HMS by transmission electron microscope (TEM), which differentiated substantially from the morphology of the as-melted HMS.
- Higher manganese silicide,
- MnSi precipitation,
- Amorphous,
- Crystal structure,
- defect
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