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Citation: Lu Er-Dong, Ji Ming-Rong, Ma Mao-Sheng, Liu Xian-Ming, Xu Peng-Shou. XPS and AES Depth Profiling Analysis of Passivity on Fe₄₀Ni₄₀P₁₄B₆ Amorphous Alloy[J]. Acta Physico-Chimica Sinica, ;1995, 11(06): 521-525. doi: 10.3866/PKU.WHXB19950609 shu

XPS and AES Depth Profiling Analysis of Passivity on Fe₄₀Ni₄₀P₁₄B₆ Amorphous Alloy

1.
National Synchrotron Radiation Laboratory,Structure Research Lab,University of Science Technology of China,Hefei 230026

Received Date: 31 March 1994
Available Online: 15 June 1995

Anodic passive films formed on Fe40Ni40P14B6 amorphous alloy in H3BO3-Na2B4O7(pH=9.20) buffer solution at different potentials or different time have been investigated by XPS and AES (including depth profiling). The thicknesses of the films were closely related to the polarization potentials and passivation time. The passive films are multilayer structure, the outmost layer FeOOH, Ni(OH)2[NiOOH] and a notable phosphate and borate, the inner layer FeOx, NiOx, POx and BOx, then the substrate. The films/substrate interface enriched Ni and P have hinder role from further oxidiation. The thicknesses of the films have been estimated by a relative method, and of passive films formation mechanism is given by explaining the growth of the anodic passive films.
- Amorphous FeNi base alloy,
- Passivation,
- Electron spectroscopy,
- Corrosion resistance
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XPS and AES Depth Profiling Analysis of Passivity on Fe40Ni40P14B6 Amorphous Alloy

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通讯作者: 陈斌, bchen63@163.com

XPS and AES Depth Profiling Analysis of Passivity on Fe₄₀Ni₄₀P₁₄B₆ Amorphous Alloy