Citation:
Yu-jing Tang a, Zhi-yong Jiang a, Hans-Friedrich Enderle b, Dieter Lilge b, Stephan V. Roth c, Rainer Gehrke c, Jens Rieger d, Li-jia An a, Yong-feng Mena. MAPPING THE DAMAGED ZONE AROUND THE CRACK TIP IN HIGH DENSITY POLYETHYLENE WITH SYNCHROTRON MICROFOCUS SMALL ANGLE X-RAY SCATTERING TECHNIQUE[J]. Chinese Journal of Polymer Science,
2010, 28(2): 165-170.
doi:
10.1007/s10118-010-8243-6
MAPPING THE DAMAGED ZONE AROUND THE CRACK TIP IN HIGH DENSITY POLYETHYLENE WITH SYNCHROTRON MICROFOCUS SMALL ANGLE X-RAY SCATTERING TECHNIQUE
摘要:
The structural changes around a crack tip in a high density polyethylene were investigated by means of scanning synchrotron microfocus small-angle X-ray scattering technique. The scattering data confirm the process of craze structure development near a crack tip based on the evolution of voids. In addition, it was found that the main stress in the plastic zone near a crack tip exhibited a gradient distribution with respect to its strength and direction. The whole damaged area showed a strain distribution indicating a flow behavior toward the crack tip.
English
MAPPING THE DAMAGED ZONE AROUND THE CRACK TIP IN HIGH DENSITY POLYETHYLENE WITH SYNCHROTRON MICROFOCUS SMALL ANGLE X-RAY SCATTERING TECHNIQUE
Abstract:
The structural changes around a crack tip in a high density polyethylene were investigated by means of scanning synchrotron microfocus small-angle X-ray scattering technique. The scattering data confirm the process of craze structure development near a crack tip based on the evolution of voids. In addition, it was found that the main stress in the plastic zone near a crack tip exhibited a gradient distribution with respect to its strength and direction. The whole damaged area showed a strain distribution indicating a flow behavior toward the crack tip.
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