引用本文:
Yan Jun GONG, Zhi Hong LI, Bao Zhong DONG. Evaluation of Average Wall Thickness of Organically Modified Mesoporous Silica[J]. Chinese Chemical Letters,
2005, 16(1): 139-142.
Citation: Yan Jun GONG, Zhi Hong LI, Bao Zhong DONG. Evaluation of Average Wall Thickness of Organically Modified Mesoporous Silica[J]. Chinese Chemical Letters, 2005, 16(1): 139-142.
Citation: Yan Jun GONG, Zhi Hong LI, Bao Zhong DONG. Evaluation of Average Wall Thickness of Organically Modified Mesoporous Silica[J]. Chinese Chemical Letters, 2005, 16(1): 139-142.
Evaluation of Average Wall Thickness of Organically Modified Mesoporous Silica
摘要:
The small angle X-ray scattering of organically modified MSU-X silica prepared by co-condensation of tetraethoxysilane (TEOS) and methyltriethoxysilane (MTES) show negative deviation from Debye's theory due to the existence of the organic interface layer. By exerting correction of the scattering negative deviation, Debye relation may be recovered, and the average wall thickness of the material may be evaluated.
English
Evaluation of Average Wall Thickness of Organically Modified Mesoporous Silica
Abstract:
The small angle X-ray scattering of organically modified MSU-X silica prepared by co-condensation of tetraethoxysilane (TEOS) and methyltriethoxysilane (MTES) show negative deviation from Debye's theory due to the existence of the organic interface layer. By exerting correction of the scattering negative deviation, Debye relation may be recovered, and the average wall thickness of the material may be evaluated.
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