引用本文:
汤晓明, 魏赛珍, 毛祖遂, 李海洋, 陈晓峰, 郑永铭. 薄膜表面的分形特征[J]. 物理化学学报,
1999, 15(05): 403-406.
doi:
10.3866/PKU.WHXB19990504
Citation: Tang Xiao-Ming, Wei Sai-Zhen, Mao Zu-Sui, Li Hai-Yang, Chen Xiao-Feng, Zheng Yong-Ming. Fractal Characteristics of Film Surface[J]. Acta Physico-Chimica Sinica, 1999, 15(05): 403-406. doi: 10.3866/PKU.WHXB19990504
Citation: Tang Xiao-Ming, Wei Sai-Zhen, Mao Zu-Sui, Li Hai-Yang, Chen Xiao-Feng, Zheng Yong-Ming. Fractal Characteristics of Film Surface[J]. Acta Physico-Chimica Sinica, 1999, 15(05): 403-406. doi: 10.3866/PKU.WHXB19990504
薄膜表面的分形特征
English
Fractal Characteristics of Film Surface
Abstract:
A fractal surface was generated on computer by random addition method. The simulated measurement on this surface shows that z resolution has little effect on calculating fractal dimension D while the lower x y resolution causes larger statistic error. D was calculated for Au films on three kind of substfate using data from Scanning Tunneling Microscope(STM) images. D = 2. 15 for Au/ceramic, and D = 2. 06 for Au/optical glass. D has different values for different points on Au/general glass, the reason of mismatch between curves from STM images of different scan sizes was also discussed.
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Key words:
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Fractal dimension
- / Film surface
- / STM
- / Computer simultion
- / Resolution
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