Citation: Tian Fang, Wang Chen, Bai Chun-Li, Xu Yu. AFM Studies of HTDIOO Monomolecular Layer LB Films[J]. Acta Physico-Chimica Sinica, 1998, 14(04): 293-298. doi: 10.3866/PKU.WHXB19980402
有机HTDIOO分子LB膜结构的AFM研究
利用原子力显微镜（AFM）对有机分子HTDIOO单层和多层LB膜结构进行了观察.实验结果表明，针尖与LB膜表面分子间的相互作用力会对成像的膜结构有影响．当悬臂针尖与LB膜表面分子的相互作用力较大时，针尖会扰动HTDIOO分子在单层LB膜中的有序排列． HTDIOO单层LB膜具有有序结构; 而在多层LB膜中，HTDIOO分子则聚集在一起形成了一定的畴结构．
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关键词:
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原子力显微镜(AFM)
- / LB膜
English
AFM Studies of HTDIOO Monomolecular Layer LB Films
The structures of HTDIOO molecular monolayer and multilayer LB films have been observed by atomic force microscopy (AFM) in molecular and nanometer scales. It demonstrates that large AFM probe tip force could damage the structure of HTDIOO LB films. Moreover, there is an ordered structure in HTDIOO monolayer LB film. While the HTDIOO molecules aggragate and form domains in multilayer LB film, which could be associated with the stripe magnetic sturcture formed in multilayer HTDIOO LB films observed with magnetic force microscopy(MFM).
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Key words:
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Atomic force microscopy
- / LB film
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