引用本文:
汤鸣, 欧阳敏, 蔡生民, 薛增泉, 刘忠范. 扫描近场光学显微镜对纳米结构的观察[J]. 物理化学学报,
1997, 13(07): 669-672.
doi:
10.3866/PKU.WHXB19970720
Citation: Tang Ming, Cai Sheng-Min, Xue Zeng-Quan, Liu Zhong-Fan. Observation of Nanometer-sized Structures Using a Scanning Near-field Optical Microscope(SNOM)[J]. Acta Physico-Chimica Sinica, 1997, 13(07): 669-672. doi: 10.3866/PKU.WHXB19970720
Citation: Tang Ming, Cai Sheng-Min, Xue Zeng-Quan, Liu Zhong-Fan. Observation of Nanometer-sized Structures Using a Scanning Near-field Optical Microscope(SNOM)[J]. Acta Physico-Chimica Sinica, 1997, 13(07): 669-672. doi: 10.3866/PKU.WHXB19970720
English
Observation of Nanometer-sized Structures Using a Scanning Near-field Optical Microscope(SNOM)
Abstract:
A polydiacetylene nanocrystalline film has been fabricated using surface evaporation method and observed by using Aurora 2000, TopoMetrix scanning near-field optical microscope (SNOM) system. The SNOM images of this film together with the standard testing Al sample indicate that the resolution of the system is better than 80 nm 1/6 of the incident wavelength, 488 nm. The possibility of SNOM data storage using thus fabricated film is also demonstrated.
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Key words:
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Near-field Optics
- / SNOM
- / Nanocrystalline
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